Relatedness of the incidence decay with exponential adjustment (IDEA) model, "Farr's law" and SIR compartmental difference equation models.

Santillana, Mauricio; Tuite, Ashleigh; Nasserie, Tahmina; Fine, Paul; Champredon, David; Chindelevitch, Leonid; Dushoff, Jonathan; Fisman, David; (2018) Relatedness of the incidence decay with exponential adjustment (IDEA) model, "Farr's law" and SIR compartmental difference equation models. Infectious disease modelling, 3. pp. 1-12. ISSN 2468-0427 DOI: https://doi.org/10.1016/j.idm.2018.03.001

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