Relatedness of the incidence decay with exponential adjustment (IDEA) model, "Farr's law" and SIR compartmental difference equation models

Santillana, M; Tuite, A; Nasserie, T; Fine, P; Champredon, D; Chindelevitch, L; Dushoff, J; Fisman, D; (2018) Relatedness of the incidence decay with exponential adjustment (IDEA) model, "Farr's law" and SIR compartmental difference equation models. Infectious disease modelling, 3. pp. 1-12. ISSN 2468-0427 DOI: https://doi.org/10.1016/j.idm.2018.03.001

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