Sensitivity analysis for nonrandom dropout: a local influence approach

Verbeke, G; Molenberghs, G; Thijs, H; Lesaffre, E; Kenward, M; (2001) Sensitivity analysis for nonrandom dropout: a local influence approach. Biometrics, 57 (1). pp. 7-14. ISSN 0006-341X DOI: https://doi.org/10.1111/j.0006-341X.2001.00007.x

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